T-2000
Large capacity, heavy duty SO device test handler for
high volume testing applications
This handler
features:
- Handles a wide variety of package sizes
- High throughput rate ( 6000 UPH in parallel mode
including 75 msec test time, 5000 UPH in serial mode
at zero test time)
- Fail-safe sorting via a system of triple interlocks
- Heavy-duty mechanisms and exclusive long-life solenoids
- No EMR during test time
- Five-sort programmable outputs
- Exclusive Tri-State Mechanism
This unique
handling innovation provides three distinct operations
within a single assembly. In the first state, precise
device alignment is achieved; in the second state, positive
Kelvin contact is made; and in the third state, after
testing is completed, the device is allowed to flow
freely into the output sorter.
Provides
True Kelvin Contact
This most
precise system of electro-mechanical lead registration
and test is available only in the T -2030. It permits
not only a true Kelvin type measurement in critical
test applications, but may be alternatively connected
to provide redundant contacts when this mode is preferred.
Handles Most
SO Packages
The smallest
SO packages present no problem for T -2030. The Tri-State
contactor assembly protects the contact fingers against
damage through misalignment or operator probing and
provides a self-registering assembly which maintains
required alignment and planarity at all times.
The T-2030 SO device test handler
combines a totally new type of contacting mechanism
with a processing system of proven reliability in customer
applications throughout the world. Each element of the
T-2030 is designed to assure continuous reliable service
under the frequently severe environments encountered
in production test applications. All complex high-speed
mechanisms have been eliminated, reducing the number
of moving elements to an absolute minimum and performing
the required mechanical functions with long-life solenoid
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