Reliability Testing
Burn-in
systems and burn-in boards
Micro
Control Company . ABES burn-in systems go well
beyond dynamic burn-in, they allow test patterns to
be generated at the device inputs and its outputs to
be compared to the expected results just like a VLSI
tester. Suitable configurations are available for memory,
logic and analog devices. Burn-In boards and burn-in
board testers are also available. for further information
please visit the Micro
Control Company's web site |
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